首页> 外国专利> METHOD OF MENUFACTURING A PROBE, PROBE AND MEASUREMENT DEVICE FOR MEASURING COMPLEX PERMITTIVITIES AND COMPLEX PERMEABILITIES

METHOD OF MENUFACTURING A PROBE, PROBE AND MEASUREMENT DEVICE FOR MEASURING COMPLEX PERMITTIVITIES AND COMPLEX PERMEABILITIES

机译:制造用于测量复介电常数和复介电常数的探针,探针和测量装置的方法

摘要

The probe manufacturing method is provided to easily charge the measured sample and reuse semi-permanently. The complex dielectric constant and complex permeability measurement probe manufacturing method comprise as follows. The step(S201) is for removing a portion of the coaxial connector in the coaxial line and for separating the coaxial connector according to the first coaxial connector and the second coaxial connector. The step(S202) is for removing a portion of the dielectric corresponding to a portion of the removed coaxial connector. A step is for electrically connecting the first coaxial connector and the second coaxial connector (S203).
机译:提供了一种探针制造方法,可以轻松地对测量的样品进行充电并半永久性地重复使用。复介电常数和复磁导率测量探针的制造方法包括以下内容。步骤(S201)用于去除同轴连接器在同轴线上的一部分,并根据第一同轴连接器和第二同轴连接器将同轴连接器分离。步骤(S202)用于去除与所去除的同轴连接器的一部分相对应的电介质的一部分。步骤是用于电连接第一同轴连接器和第二同轴连接器(S203)。

著录项

  • 公开/公告号KR100877941B1

    专利类型

  • 公开/公告日2009-01-12

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20070051727

  • 发明设计人 천창율;박상복;정용식;권영우;

    申请日2007-05-28

  • 分类号G01R1/067;

  • 国家 KR

  • 入库时间 2022-08-21 19:12:17

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