A method for characterizing waveform recorder errors using the power spectral distribution

摘要

A new approach for analyzing the errors observed in sine wave tests of waveform recorders is presented. The approach involves estimating the power spectral distribution for the residuals observed from a sine wave test. The approach is compared to the more common approach of calculating the Fourier transform of the recorded signal. It is shown that the new approach is easier to interpret quantitatively, and its use is demonstrated on some test data.