Testing methodologies for analog-to-digital converters

摘要

A theoretical approach and an experimental test system devoted to introducing a set of parameters based on Walsh functions and conformed to characterize the transfer function of analog-to-digital converters are presented. Building on the previous work, the authors propose an enhanced system that provides better accuracy in the evaluation of the performance of conversion devices under dynamic conditions. The theory covers an introductive approach to generalize the conversion processes and employs a powerful purpose-oriented tool to understand their in-depth operativity. The error parameters are defined by mathematical algorithms based on Walsh functions and related transform, while their properties are correlated to a standard reference input, a triangular waveform provided by the system. This methodology opens the wave towards the introduction of standard techniques in testing conversion devices.