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High-speed laser wafer scribing

机译:高速激光晶圆划片

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摘要

The tight, narrow, clean cuts achievable with UV laser scribing provide better die count per wafer and higher yields due to fewer damaged die. Precision scribing of wafers with ultraviolet (UV) lasers has emerged as an alternative method of scribing for separation, particularly for brittle compound semiconductor wafer materials such as thin silicon wafers. UV diode-pumped solid-state (DPSS) lasers rapidly process wafers with kerfs of less than 3 microns in thin or thick wafers without edge chipping in all the Ⅲ-Ⅴ materials, including Ⅳ materials such as Silicon (Si) and Germanium (Ge), and straight, accurate, cleaner cuts particularly for Gallium Arsenide (GaAs) wafers. GaAs wafers are expensive, so wafer real estate is valuable. The tighter, narrower, cleaner cuts achievable with UV laser scribing provide better die count per wafer and higher yields due to fewer damaged die. The laser scribing process operates within 20-micron streets or narrower.
机译:UV激光划刻可实现紧密,狭窄,整洁的切割,从而减少了每个晶片的裸片数量,并减少了损坏的裸片,从而提高了良率。用紫外线(UV)激光对晶圆进行精确划刻已经成为一种替代方法,特别是对于脆性化合物半导体晶圆材料(例如薄硅晶圆)而言,可以进行划刻。 UV二极管泵浦固态(DPSS)激光器可快速处理厚度小于3微米的薄或厚晶片中的切缝,而不会在所有Ⅲ-Ⅴ类材料(包括Ⅳ类材料,如硅(Si)和锗(Ge) ),并且直线,准确,清洁的切割效果尤其适用于砷化镓(GaAs)晶圆。 GaAs晶圆价格昂贵,因此晶圆面积非常宝贵。 UV激光划刻可实现更紧密,更窄,更清洁的切割,由于每个晶片的损坏较少,因此可提供更好的每个晶片的晶片数和更高的良率。激光划片过程在20微米或更窄的街道上进行。

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