机译:零故障GaAs MMIC寿命测试数据的经验统计分析
School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China;
School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China;
School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China;
School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China;
School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China;
School of Aeronautics and Astronautics, Zhejiang University, Hangzhou, China;
MMICs; reliability; failure; accelerated testing; Weibull distribution; lognormal distribution;
机译:衬底电流在GaAs MMIC可靠性寿命测试中的作用
机译:射频刺激下的寿命测试GaAs MMIC
机译:单级MMIC放大器的加速寿命测试和故障分析
机译:GaAs MMIC寿命测试数据分析的统计分布比较
机译:异构群效应加速寿命试验的数据分析和实验设计
机译:采用渐进式混合检查的逐步应力部分加速寿命试验中掩盖式混合系统寿命数据的统计分析
机译:GaAs单片KU波段驱动放大器的可靠性寿命测试和故障分析
机译:基于石英的Gaas平面肖特基二极管的加速寿命测试和失效分析