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Accelerated Lifetime Testing and Failure Analysis of Quartz Based GaAs Planar Schottky Diodes

机译:基于石英的Gaas平面肖特基二极管的加速寿命测试和失效分析

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摘要

Accelerated lifetime tests have been performed on intergrated planar GaAs Schottky diodes that were bonded to quartz substrates up-side-down with a heat-cured epoxy.

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