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Multi-level reading method by using PCI(Paired Cell Interference) in vertical NAND flash memory

机译:垂直NAND闪存中使用PCI(Paired Cell Interference,配对单元干扰)的多级读取方法

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摘要

The 3-dimensional folded NAND array having vertical channels has a large integration density and reliable memory characteristics without short channel effect. But, this kind of 3-D memory with vertical channels experiences inevitable interference between cells on both sides of a single silicon pillar, which is called PCI(Paired Cell Interference). As the thickness of silicon fin is scaled down, this phenomenon becomes severer. Consequently, the PCI is a crucial scaling restriction factor of vertical type flash memory. In this paper, we propose a multi-level reading method which utilizes PCI.
机译:具有垂直通道的3维折叠NAND阵列具有大的集成密度和可靠的存储特性,而没有短通道效应。但是,这种具有垂直通道的3-D存储器在单个硅柱两侧的单元之间不可避免地会受到干扰,这称为PCI(成对单元干扰)。随着硅鳍片的厚度按比例缩小,这种现象变得更加严重。因此,PCI是垂直型闪存的关键缩放限制因素。在本文中,我们提出了一种利用PCI的多级读取方法。

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  • 来源
    《電子情報通信学会技術研究報告》 |2009年第98期|p.197-200|共4页
  • 作者单位

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

    Inter-university Semiconductor Research Center and School of Electrical Engineering, Seoul National University San 56-1, Sillim-dong, Gwanak-gu, Seoul 151-742, Republic of Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    NAND flash memory; 3-D array; PCI(paired cell interference);

    机译:NAND闪存;3-D阵列;PCI(成对小区干扰);
  • 入库时间 2022-08-18 00:35:41

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