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Circuit and method of reading multi-level NAND flash memory cell

机译:读取多级NAND闪存单元的电路和方法

摘要

The disclosed is a method of reading a multi-level NAND flash memory cell and a circuit for the same. The read circuit for the NAND flash memory device includes a NAND flash memory cell having multi-level information, a first page buffer for storing an upper-bit, a second page buffer for storing a lower bit, and pass transistor for changing information of the second page buffer according to a variation of the first page buffer. In accordance with the present invention, "00" or "01" information is read out by applying a first voltage to a word line of the cell. "00", "01", or "11" information is read out by applying a second voltage to the word line. A latch pass control signal is applied to a pass transistor. Thus, it is possible to read out "00", "01", "11", or "10" information.
机译:公开了一种读取多层NAND闪存单元的方法及其电路。用于NAND快闪存储器件的读取电路包括具有多级信息的NAND快闪存储单元,用于存储高位的第一页面缓冲器,用于存储低位的第二页面缓冲器以及用于改变存储单元的信息的传输晶体管。第二页缓冲器根据第一页缓冲器的变化。根据本发明,通过向单元的字线施加第一电压来读出“ 00”或“ 01”信息。通过向字线施加第二电压来读出“ 00”,“ 01”或“ 11”信息。锁存器通过控制信号被施加到通过晶体管。因此,可以读出“ 00”,“ 01”,“ 11”或“ 10”信息。

著录项

  • 公开/公告号JP4707386B2

    专利类型

  • 公开/公告日2011-06-22

    原文格式PDF

  • 申请/专利号JP20040370055

  • 发明设计人 張 承鎬;

    申请日2004-12-21

  • 分类号G11C16/06;G11C16/02;G11C16/04;

  • 国家 JP

  • 入库时间 2022-08-21 18:19:04

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