Latch-up characterization using novel test structures and instruments

摘要

A test structure for quickly determining the latch-up sensitivity of different geometries and the technological solutions in CMOS processes is presented. The structure permits the measurement of triggering and holding voltages with a simple oscilloscope and a voltage source. The device consists of an integrated astable oscillator (based on a p-n-p-n structure) that must be characterized. The good behavior of the measurement set-up is demonstrated by designing, fabricating and characterizing the latch-up of two different CMOS technologies using the test structure and instruments. Furthermore, the use of simple digitizing oscilloscopes facilitates obtaining statistical latch-up data.