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GaAs pHEMT-based technology for microwave applications in a volume MMIC production environment on 150-mm wafers

机译:基于GaAs pHEMT的技术,用于在150 mm晶圆上的批量MMIC生产环境中的微波应用

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摘要

The establishment of a 150-mm (6-in) gallium arsenide (GaAs) facility is described together with the development of very high yielding and cost-effective semiconductor device technologies and a manufacturing capacity of over 40000 wafers/annum. The background to the demand for very high volumes of RF products for this market is discussed, together with the prospects for future growth. The paper describes recent process development by the utilization of a data-driven yield management system to support the delivery of high-quality RF products to customers. Finally, "end of line" DC and RF testing of finished 150-mm GaAs pHEMT foundry wafers is described, enabling scalar measurements of power, noise, and intermodulation products as well as vector measurements of S-parameters and noise parameters at frequencies of up to 40 GHz.
机译:描述了建立150毫米(6英寸)砷化镓(GaAs)设施的过程,同时还开发了非常高产且具有成本效益的半导体器件技术,并且制造能力超过了40000个晶片/年。讨论了该市场对大量射频产品的需求背景以及未来的增长前景。本文介绍了通过利用数据驱动的成品率管理系统来支持向客户交付高质量RF产品的最新工艺开发。最后,描述了完成的150mm GaAs pHEMT铸造晶圆的“线下” DC和RF测试,可以对功率,噪声和互调产物进行标量测量,以及在频率高达200Hz时对S参数和噪声参数进行矢量测量。至40 GHz。

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