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首页> 外文期刊>IEEE Transactions on Semiconductor Manufacturing >GaAs pHEMT-based technology for microwave applications in a volume MMIC production environment on 150-mm wafers
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GaAs pHEMT-based technology for microwave applications in a volume MMIC production environment on 150-mm wafers

机译:基于GAAS PHEMT的技术用于150毫米晶圆的卷MMIC生产环境中的微波应用技术

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摘要

The establishment of a 150-mm (6-in) gallium arsenide (GaAs) facility is described together with the development of very high yielding and cost-effective semiconductor device technologies and a manufacturing capacity of over 40000 wafers/annum. The background to the demand for very high volumes of RF products for this market is discussed, together with the prospects for future growth. The paper describes recent process development by the utilization of a data-driven yield management system to support the delivery of high-quality RF products to customers. Finally, "end of line" DC and RF testing of finished 150-mm GaAs pHEMT foundry wafers is described, enabling scalar measurements of power, noise, and intermodulation products as well as vector measurements of S-parameters and noise parameters at frequencies of up to 40 GHz.
机译:建立150毫米(6英寸)砷化镓(GaAs)设施(GaAs)设施以及非常高的屈服和经济高效的半导体器件技术的发展以及超过40000晶圆/年的制造能力。讨论了对该市场的高卷RF产品的需求的背景,并与未来增长的前景一起进行了讨论。本文通过利用数据驱动的产量管理系统来支持向客户提供高质量的RF产品的进程开发。最后,描述了成品150mM GaAs Phemt铸造晶片的“线结束”DC和RF测试,使得功率,噪声和互调产品的标量测量以及S频率下的S参数和噪声参数的矢量测量值到40 GHz。

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