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Treatment of general dependencies in system fault-tree and risk analysis

机译:系统故障树和风险分析中一般依赖性的处理

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Implicit and explicit methods are described for reliability and risk analysis of systems with dependent or correlated basic events. General rules are presented for modeling any group of n mutually s-dependent events with 2/sup n/-1 s-independent events. The probabilities of these virtual events are determined based on the joint probabilities of the original s-dependent events, typically known by s-correlation or conditional probabilities. The transformations preserve the values of all terms (e.g., minimal cut sets), independent of system success criteria. This facilitates general use of ordinary fault-tree computer codes that assume basic events to be s-independent. Explicit basic event probabilities are obtained for calculating the probability of failure on demand of standby safety systems when the s-dependency is caused by scheduling and synchronization of test episodes between n redundant components (1 /spl les/ n /spl les/ 4), and by statistical variation of failure rates. Interesting "negative probabilities" are encountered in this exercise, mainly due to negative s-correlation between the component unavailabilities with staggered testing. Results obtained for human-error events are useful when the conditional probability to repeat an error is larger than the probability of an error in a single isolated task. Explicit results are obtained for systems with time-related common-cause failures modeled by general multiple failure rates. The impacts of test intervals and test staggering are included. Staggered testing is optimal with an ETR (extra-testing rule), although ETR is not important for 1-out-of-n:G systems. An economic model provides insights into the impacts of various parameters: the optimal test interval increases with increasing redundancy and testing cost, and it decreases with increasing accident cost and initiating event rate. Staggered testing with ETR allows for the longest optimal test intervals. Rules are presented for changing s-dependency probabilities when some component is known to be failed. Current fault-tree quantification tools are not well geared to use the implicit method in spite of the fact that it would simplify the fault-tree construction, reduce the number of cut sets, and allow different types of dependencies or correlations in the analysis. A recommendation is to computerize the implicit method or include it as an option to current codes. It would need only a data table for joint probabilities and the ability to pick-up data from this table whenever two or more of the s-dependent events appear in a term (or a cut set).
机译:描述了隐式和显式方法,用于对具有相关或相关基本事件的系统进行可靠性和风险分析。提出了通用规则,用于对具有2 / s个n / -1 s独立事件的n组相互依赖的事件进行建模。这些虚拟事件的概率是基于原始s相关事件的联合概率(通常由s相关或条件概率已知)确定的。转换保留所有项的值(例如,最小割集),与系统成功标准无关。这有助于一般故障树计算机代码的通用使用,这些代码假定基本事件与s无关。当s依赖性是由于n个冗余组件(1 / spl les / n / spl les / 4)之间的测试事件的调度和同步引起s依赖性时,获得了显式的基本事件概率,用于计算备用安全系统需求时的故障概率,以及故障率的统计变化。在此练习中遇到有趣的“负概率”,这主要是由于在交错测试中组件不可用性之间存在负s相关。当重复错误的条件概率大于单个孤立任务中的错误概率时,针对人为错误事件获得的结果很有用。对于具有与时间相关的常见原因故障的系统,可以通过一般的多重故障率建模来获得明确的结果。测试间隔和测试交错的影响也包括在内。尽管ETR对于n:G以外的系统不重要,但使用ETR(额外测试规则)时,交错测试是最佳选择。经济模型可以洞悉各种参数的影响:最佳测试间隔随着冗余和测试成本的增加而增加,而随着事故成本和事件发生率的增加而减小。使用ETR进行交错测试可以实现最长的最佳测试间隔。提出了一些规则,用于在已知某些组件发生故障时更改s相关性概率。尽管当前的故障树量化工具将简化故障树的构造,减少切割集的数量并允许在分析中使用不同类型的依存关系或相关性,但仍无法很好地适应使用隐式方法。建议将隐式方法计算机化或将其作为当前代码的选项。只要有两个或多个与s相关的事件出现在一个术语(或割集)中,就只需要一个数据表以获取联合概率以及从该表中获取数据的能力。

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