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Radiation damage studies with STAR silicon drift detectors

机译:使用STAR硅漂移探测器进行辐射损伤研究

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Large (6.3/spl times/6.3 cm/sup 2/) linear Silicon Drift Detectors were developed for use in the SVT, the inner tracking detector of the STAR experiment at the RHIC Collider. The concern of this paper is to estimate the effects of neutron and proton radiation damage to these devices and associated electronics. Detectors and their associated electronics were irradiated with 10/sup 11/-10/sup 12//cm/sup 2/, 1 MeV equivalent neutrons and 10/sup 10/-10/sup 12//cm/sup 2/, 24 GeV protons. I-V and C-V characteristics of diode test structures were used to determine depletion voltages, lifetimes, and reverse bias values. Measurements of the voltage and drift linearity with laser injection show the effects of irradiation on the detector performance. Measurements of noise levels show the effects of irradiation on the front-end electronics.
机译:开发了大型(6.3 / spl次/6.3 cm / sup 2 /)线性硅漂移探测器,用于SVT,这是RHIC对撞机STAR实验的内部跟踪探测器。本文关注的是评估中子和质子辐射对这些设备和相关电子设备的损害。用10 / sup 11 / -10 / sup 12 // cm / sup 2 /,1 MeV当量中子和10 / sup 10 / -10 / sup 12 // cm / sup 2 /,24对探测器及其相关电子设备进行辐照。 GeV质子。二极管测试结构的I-V和C-V特性用于确定耗尽电压,寿命和反向偏置值。激光注入对电压和漂移线性的测量表明了辐射对检测器性能的影响。噪声水平的测量显示了辐射对前端电子设备的影响。

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