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Comparison between magneto-optic and VSM measurements of bias-sputtered CoCr films with perpendicular anisotropy

机译:具有垂直各向异性的偏压溅射CoCr薄膜的磁光和VSM测量的比较

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A direct comparison between surface and bulk hysteresis behavior is made on a variety of bias-sputtered CoCr films using magnetooptic and VSM (vibrating sample magnetometer) techniques. The results show that bias sputtering at around -100 V leads to an improvement in the surface as well as the volume magnetic properties of CoCr films. Furthermore, a reversal in the magnitude of surface and volume coercivities is observed when the Cr content of the films exceeds 13 at.% and the film thickness increases above 0.4 mu m. These effects are attributed to the presence of pores on the film surface which affect the demagnetizing factor of the surface with respect to the volume. The magnetooptical rotation signal obtained from the surface and the back of the films is used to assess their respective saturation magnetization and, hence, the extent of Cr solubility or segregation at the two boundaries.
机译:使用磁光和VSM(振动样品磁强计)技术,在各种偏置溅射CoCr膜上直接比较了表面磁滞和体磁滞行为。结果表明,在-100 V附近进行偏压溅射可改善CoCr膜的表面以及体积磁性能。此外,当膜的Cr含量超过13原子%并且膜厚度增加到0.4μm以上时,观察到表面和体积矫顽力的大小发生了反转。这些效应归因于膜表面上存在孔,这些孔影响表面相对于体积的消磁因子。从膜的表面和背面获得的磁光旋转信号用于评估其各自的饱和磁化强度,从而评估两个边界处的Cr溶解度或偏析程度。

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