首页> 外文期刊>IEEE transactions on device and materials reliability >Hybrid-Organic-Photodetector Containing Chemically Treated ZnMgO Layer With Promising and Reliable Detectivity, Responsivity and Low Dark Current
【24h】

Hybrid-Organic-Photodetector Containing Chemically Treated ZnMgO Layer With Promising and Reliable Detectivity, Responsivity and Low Dark Current

机译:含有经过化学处理的ZnMgO层的混合有机光电探测器,具有可靠的检测能力,响应能力和低暗电流

获取原文
获取原文并翻译 | 示例

摘要

The glass/ITO/ZnO/ZnMgO/PEOz/PCBM/P3HT: PCBM/CH3-SAM/PEDOT: PSS/Ag structure is used to fabricate a hybrid organic photodetector (HOP). The device operates with an optimized detectivity of 4.8 x 10(14) Hz(1/2)/W and a responsivity of 2.63 x 10(2)A/W. ZnMgO nanorods, mostly textured (with (002) orientation) and with hexagonal morphology, are made using a post-thin-film-deposition chemo-thermal process. This process helps in passivation of trap states in ZnO. The device structure reported aids in: 1) obtaining a promising broadband UV photoresponse and 2) improvement in charge collection efficiency (J(sc)similar to 120 mA/cm(2)). J(sc) obtained in this device is similar to 30 times higher than the samples that only use ZnO nanorods. The photocurrent decay is dominated by a slow process with a characteristic decay time of 198 mu s. This is attributable to the presence of deep traps (less density of free carriers than a large density of trap states), indicating that the defect states in ZnO are not completely eliminated even with the chemothermal passivation step used. The PEOz and CH3-SAM layers in the device contribute to a reduction in dark current, and an improvement in spectral response. The results presented here are of direct relevance to the current state of the-art in UV-HOP devices.
机译:玻璃/ ITO / ZnO / ZnMgO / PEOz / PCBM / P3HT:PCBM / CH3-SAM / PEDOT:PSS / Ag结构用于制造混合有机光电探测器(HOP)。该设备的最佳检测灵敏度为4.8 x 10(14)Hz(1/2)/ W,响应度为2.63 x 10(2)A / W。 ZnMgO纳米棒主要采用后镀膜化学热加工工艺制成,具有很多纹理((002)取向)和六边形形态。此过程有助于钝化ZnO中的陷阱态。报告的设备结构有助于:1)获得有希望的宽带UV光响应,以及2)改善电荷收集效率(J(sc)类似于120 mA / cm(2))。与仅使用ZnO纳米棒的样品相比,在该设备中获得的J(sc)大约高30倍。光电流衰减主要由缓慢的过程控制,其特征衰减时间为198μs。这归因于深陷阱的存在(自由载流子的密度小于陷阱态的大密度),这表明即使使用化学热钝化步骤,ZnO中的缺陷态也不能完全消除。器件中的PEOz和CH3-SAM层有助于减少暗电流,并改善光谱响应。此处介绍的结果与UV-HOP设备中的最新技术水平直接相关。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号