An efficient optimization method for the statistical design of integrated circuits is presented. This method, called the pseudo yield function substitution (PYFS) algorithm, is developed to help a designer select design parameters to maximize the product yield. The design goal of PYFS is to use fewer simulation runs to reach a yield-optimized design. This is accomplished with the development of an improved response surface method for accurate estimation of the circuit response function, and the use of a novel PYFS method for yield maximization.
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