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I/O Clustering in Design Cost and Performance Optimization for Flip-Chip Design

机译:倒装芯片设计的I / O集群设计成本和性能优化

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Input-output (I/O) placement has always been a concern in modern integrated circuit design. Due to flip-chip technology, I/O can be placed throughout the whole chip without long wires from the periphery of the chip. However, because of I/O placement constraints in design cost (DC) and performance, I/O buffer planning becomes a pressing problem. During the early stages of circuits and package co-design, I/O layout should be evaluated to optimize DC and to avoid product failures. The objective of this brief is to improve the existing/initial standard cell placement by I/O clustering, considering DC reduction and signal integrity preservation. The authors formulate it as a minimum cost flow problem that minimizes alphaW+betaD, where W is the I/O wirelength of the placement and D is the total voltage drop in the power network and, at the same time, reduces the number of I/O buffer blocks. The experimental results on some Microelectronics Center of North Carolina benchmarks show that the author's method averagely achieves better timing performance and over 32% DC reduction when compared with a conventional rule-of-thumb design that is popularly used by circuit designers
机译:输入输出(I / O)放置一直是现代集成电路设计中关注的问题。由于采用了倒装芯片技术,因此I / O可以放置在整个芯片上,而无需从芯片外围伸出长线。但是,由于I / O放置在设计成本(DC)和性能方面的限制,因此I / O缓冲区规划成为一个紧迫的问题。在电路和封装协同设计的早期阶段,应评估I / O布局以优化DC并避免产品故障。本摘要的目的是考虑DC减少和信号完整性保护,通过I / O群集改善现有/初始标准单元放置。作者将其公式化为最小化成本流的问题,该问题使alphaW + betaD最小化,其中W是布局的I / O线长,D是电网中的总压降,同时减少了I的数量/ O缓冲区块。在北卡罗来纳州微电子学中心的一些基准测试结果表明,与电路设计师普遍使用的常规经验法则设计相比,该作者的方法平均可实现更好的定时性能和32%以上的DC降低

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