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A Linear-Time Approach for Static Timing Analysis Covering All Process Corners

机译:涵盖所有过程角点的静态时序分析的线性时间方法

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Manufacturing process variations lead to circuit timing variability and a corresponding timing yield loss. Traditional corner analysis consists of checking all process corners (combinations of process parameter extremes) to make sure that circuit timing constraints are met at all corners, typically by running static timing analysis (STA) at every corner. This approach is becoming too expensive due to the increase in the number of corners with modern processes. As an alternative, we propose a linear-time approach for STA which covers all process corners in a single pass. Our technique assumes a linear dependence of delays and slews on process parameters and provides estimates of the worst case circuit delay and slew. It exhibits high accuracy in practice, and if the circuit has $m$ gates and $n$ relevant process parameters, the complexity of the algorithm is ${cal O}(mn)$.
机译:制造工艺的变化会导致电路时序变化和相应的时序良率损失。传统的拐角分析包括检查所有过程拐角(过程参数极限值的组合),以确保通常在每个拐角处运行静态时序分析(STA)来确保在所有拐角处都满足电路时序约束。由于现代工艺中转角数量的增加,这种方法变得太昂贵了。作为替代方案,我们为STA提出了一种线性时间方法,该方法一次覆盖了所有过程角点。我们的技术假设延迟和转换对过程参数的线性依赖性,并提供最坏情况下电路延迟和转换的估计。它在实践中表现出很高的准确性,如果电路具有$ m $个门和$ n $个相关的工艺参数,则算法的复杂度为$ {cal O}(mn)$。

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