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Energy, Performance, and Probability Tradeoffs for Energy-Efficient Probabilistic CMOS Circuits

机译:节能型CMOS电路的能量,性能和概率折衷

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The scaling trend of semiconductor devices has raised several issues such as energy consumption and heat dissipation, as well as the increasing probabilistic behavior of devices. Motivated by the necessity to consider probabilistic approaches to future designs, probabilistic cmos (PCMOS) based computing has been proposed. PCMOS devices are inherently probabilistic devices that compute correctly with a probability $p$. This paper investigates the tradeoffs between the energy, speed (or performance), and probability of correctness $(p)$ of PCMOS circuits. For given constraints on $p$, performance, and energy delay product (edp), and using analytical models of energy, delay, and $p$, the optimum values of edp and probability are found for PCMOS circuits. The analytical models are validated using circuit simulations for PCMOS circuits designed in a 0.13-$mu{hbox {m}}$ process. The results show that, to minimize edp, it is preferable to operate PCMOS circuits at lower supply voltages. On the other hand, to maximize $p$, the highest possible supply voltage under the given constraints is preferable. Our analysis makes it possible to achieve an optimal circuit design that satisfies the $p$ , performance, and edp requirements for a given application. An analysis of the impact of variations in temperature, threshold voltage, and supply voltage on optimal edp and probability values is also included.
机译:半导体器件的规模化趋势提出了一些问题,例如能耗和散热,以及器件的概率性不断提高。出于考虑未来设计的概率方法的动机,已经提出了基于概率CMOS(PCMOS)的计算。 PCMOS装置本质上是概率装置,可以以概率$ p $正确计算。本文研究了PCMOS电路的能量,速度(或性能)和正确性概率$(p)$之间的权衡。对于给定的$ p $,性能和能量延迟乘积(edp)约束,并使用能量,延迟和$ p $的分析模型,可以找到PCMOS电路的edp和概率的最佳值。使用在0.13-μmu{hbox {m}} $工艺中设计的PCMOS电路的电路仿真对分析模型进行了验证。结果表明,为了使edp最小,最好在较低的电源电压下运行PCMOS电路。另一方面,为了使$ p $最大化,在给定约束下尽可能高的电源电压是可取的。通过我们的分析,可以实现满足给定应用的$ p $,性能和edp要求的最佳电路设计。还包括对温度,阈值电压和电源电压变化对最佳edp和概率值的影响的分析。

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