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Leakage Power Analysis Attacks: A Novel Class of Attacks to Nanometer Cryptographic Circuits

机译:泄漏功率分析攻击:对纳米密码电路的新型攻击

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In this paper, a novel class of power analysis attacks to cryptographic circuits is presented. These attacks aim at recovering the secret key of a cryptographic core from measurements of its static (leakage) power. These attacks exploit the dependence of the leakage current of CMOS integrated circuits on their inputs (including the secret key of the cryptographic algorithm that they implement), as opposite to traditional power analysis attacks that are focused on the dynamic power. For this reason, this novel class of attacks is named ????????leakage power analysis???????? (LPA). Since the leakage power increases much faster than the dynamic power at each new technology generation, LPA attacks are a serious threat to the information security of cryptographic circuits in sub-100-nm technologies. For the first time in the literature, a well-defined procedure to perform LPA attacks that is based on a solid theoretical background is presented. Advantages and measurement issues are also analyzed in comparison with traditional power analysis attacks based on dynamic power measurements. Examples are provided for various circuits, and an experimental attack to a register is performed for the first time. An analytical model of the LPA attack result is also provided to better understand the effectiveness of this technique. The impact of technology scaling is explicitly addressed by means of a simple analytical model and Monte Carlo simulations. Simulations on a 65- and 90-nm technology and experimental results are presented to justify the assumptions and validate the leakage power models that are adopted.
机译:在本文中,提出了一种新型的对密码电路的功率分析攻击。这些攻击旨在通过测量其静态(泄漏)功率来恢复加密核心的秘密密钥。这些攻击利用了CMOS集成电路的泄漏电流对其输入(包括它们实现的加密算法的密钥)的依赖性,这与专注于动态功率的传统功率分析攻击相反。因此,这种新型的攻击称为“泄漏功率分析”。 (LPA)。由于每一代新技术的泄漏功率增加速度都比动态功率大得多,因此LPA攻击严重威胁了100纳米以下技术中密码电路的信息安全。在文献中,首次提出了基于扎实的理论背景进行LPA攻击的定义明确的过程。与基于动态功率测量的传统功率分析攻击相比,还分析了优势和测量问题。提供了各种电路的示例,并且首次对寄存器进行了实验性攻击。还提供了LPA攻击结果的分析模型,以更好地了解此技术的有效性。通过简单的分析模型和蒙特卡洛模拟,可以明确解决技术扩展的影响。给出了在65纳米和90纳米技术上的仿真结果以及实验结果,以证明这些假设合理并验证所采用的泄漏功率模型。

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