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The Effects of Inter-Symbol Interference in Dynamic Element Matching DACs

机译:符号间干扰对动态元件匹配DAC的影响

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Dynamic element matching (DEM) is often applied to multi-bit DACs to avoid nonlinear distortion that would otherwise result from inevitable mismatches among nominally identical circuit elements. Unfortunately, for such a DEM DAC to fully achieve this objective its constituent 1-bit DACs must be free of inter-symbol interference (ISI), i.e., the error from each 1-bit DAC must not depend on prior samples of the DAC's input sequence. This paper provides the first quantitative general analysis of the effects of ISI on the continuous-time outputs of DEM DACs. The analysis provides some surprising insights such as the conclusion that for certain types of DEM the only nonlinear distortion caused by ISI is second-order distortion. The paper also presents a digital pre-distortion technique that cancels the second-order distortion in the DEM DAC's first Nyquist band if information about the 1-bit DAC mismatches is available.
机译:动态元件匹配(DEM)通常应用于多位DAC,以避免非线性失真,否则非线性失真将由名义上相同的电路元件之间不可避免的失配引起。不幸的是,要使这样的DEM DAC完全实现这一目标,其组成的1位DAC必须没有符号间干扰(ISI),即,每个1位DAC产生的误差必须不取决于DAC输入的先前采样序列。本文提供了对ISI对DEM DAC的连续时间输出的影响的第一个定量的一般分析。该分析提供了一些令人惊讶的见解,例如得出以下结论:对于某些类型的DEM,由ISI引起的唯一非线性失真是二阶失真。本文还提出了一种数字预失真技术,如果可获得有关1位DAC不匹配的信息,则可以消除DEM DAC的第一个奈奎斯特频带中的二阶失真。

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