Transient response testing of analogue components in mixed-signal systems: a review

摘要

Transient response testing has developed over the last few years from a benchtop characterisation technique into a very powerful production test technique for all types of analogue components in mixed-signal electronic systems. The author reviews recent progress in this area, summarising results from both simulations and work on real circuits, then briefly describes the directions in which current research work is progressing.