Automated Digital Computer Program for Determining Responses of Electronic Systems to Transient Nuclear Radiation. Volume III. Treat Component Analysis Program

摘要

The TREAT (Transient Radiation Effect Automated Tabulation) system of six independent, but complementary, digital computer programs was developed to aid in the processing of data on transient and permanent effects of radiation on electronic components. Each program treats a particular aspect of the over-all processing task. Given raw laboratory data recorded before and after irradiation, the system provides calculated device parameters for each sample and the radiation induced change in these parameters. These data are combined with radiation environment information, also processed by the system, and applied to theoretical equations to predict the response or damage to device parameters during irradiation. Information on typical rather than specific devices and/or radiation environments is also available for typical response predictions. As many as 1000 samples each of transistors, diodes, and capacitors can be processed concurrently. The report contains a complete functional description of the system as well as all necessary operating instructions. (Author)