Challenges and Solutions in Emerging Memory Testing

Elena Ioana Vatajelu; Paolo Prinetto; Mottaqiallah Taouil; Said Hamdioui

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Challenges and Solutions in Emerging Memory Testing

机译：新兴内存测试中的挑战和解决方案

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摘要

The research and prototyping of new memory technologies are getting a lot of attention in order to enable new (computer) architectures and provide new opportunities for today's and future applications. Delivering high quality and reliability products was

机译：为了实现新的（计算机）体系结构并为当今和未来的应用提供新的机会，新的内存技术的研究和原型设计引起了很多关注。提供高质量和可靠性的产品是

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来源
《Emerging Topics in Computing, IEEE Transactions on》 |2019年第3期|493-506|共14页
作者
Elena Ioana Vatajelu; Paolo Prinetto; Mottaqiallah Taouil; Said Hamdioui;
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作者单位

TIMA Laboratory University Grenoble Alps Grenoble France;

CINI Cybersecurity National Lab & Politecnico di Torino Torino Italy;

Delft University of Technology Delft the Netherlands;

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原文格式 PDF
正文语种 eng
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关键词
Random access memory; Through-silicon vias; Three-dimensional displays; Stacking; Microprocessors; Memory management;

机译：随机存取存储器;硅通孔;三维显示器;堆叠;微处理器;内存管理;

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1. State of the art and challenges for test and reliability of emerging nonvolatile resistive memories [J] . Vatajelu Elena Ioana, Pouyan Peyman, Hamdioui Said International journal of circuit theory and applications . 2018,第1期

机译：最新技术以及新兴非易失性电阻式存储器的测试和可靠性挑战
2. Find and fix: counter-UAV solutions emerge to tackle latest challenges [J] . Huw Williams Jane's international defense review . 2016,第feba期

机译：查找并修复：反无人机解决方案应运而生，以应对最新挑战
3. High-Bandwidth Memory (HBM) Test Challenges and Solutions [J] . Hongshin Jun, Sangkyun Nam, Hanho Jin, Design & Test of Computers, IEEE . 2017,第1期

机译：高带宽内存（HBM）测试挑战和解决方案
4. Test challenges and solutions for emerging non-volatile memories [C] . Mohammad Nasim Imtiaz Khan, Swaroop Ghosh IEEE VLSI Test Symposium . 2018

机译：测试新兴非易失性存储器的挑战和解决方案
5. Challenges and Solutions for Large-Scale Integration of Emerging Technologies [D] . Iqbal, Md. Arif. 2021

机译：新兴技术大规模集成的挑战与解决方案
6. Delaying memory decline: different options and emerging solutions [O] . Felicitas Schneider, Alan Horowitz, Klaus-Peter Lesch, 2020

机译：延迟内存下降：不同的选择和新兴的解决方案
7. Testing Computation-in-Memory Architectures Based on Emerging Memories [O] . Said Hamdioui, Moritz Fieback, Surya Nagarajan, 2019

机译：基于新出现的存储器测试内存计算内存架构

Challenges and Solutions in Emerging Memory Testing

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