32-GHz cryogenically cooled HEMT low-noise amplifiers

摘要

The cryogenic noise temperature performances of a two-stage and a three-stage 32-GHz HEMT (high-electron-mobility transistor) amplifier were evaluated. The amplifiers utilize quarter-micrometer conventional AlGaAs/GaAs HEMT devices, hybrid matching input and output microstrip circuits, and a cryogenically stable DC biasing network. The noise temperature measurements were performed in the frequency range of 31 to 33 GHz over a physical temperature range of 300 to 12 K. Across the measurement band, the amplifiers displayed a broadband response, and the noise temperature was observed to decrease by a factor of ten in cooling from 300 to 15 K. The lowest noise temperature measured for the two-stage amplifier at 32 GHz was 35 K with an associated gain of 16.5 dB, while for the three-stage amplifier it was 39 K with an associated gain of 26 dB. It was further observed that both amplifiers were insensitive to light.