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首页> 外文期刊>IEEE Transactions on Electron Devices >Characteristics of Cr Schottky amorphous silicon photodiodes and their application to linear image sensors
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Characteristics of Cr Schottky amorphous silicon photodiodes and their application to linear image sensors

机译:Cr肖特基非晶硅光电二极管的特性及其在线性图像传感器中的应用

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摘要

Cr Schottky amorphous silicon (a-Si:H) photodiodes with a configuration of Cr/a-Si:H tin-doped indium oxide (ITO), where Cr is negatively biased with respect to ITO in contrast to the conventional bias direction, were characterized to provide simple and stable sensor elements for economical linear image sensors. It was found that the barrier height of the Cr/a-Si:H junction is sufficiently high (0.89 eV) to prevent electron injection and that the junction is thermally stable. The transport properties of holes propagating in the a-Si:H layer were largely improved by a few parts per million boron doping, and as a result saturation of the photocurrent was achieved. A contact-type ISO A4, 8-dot/mm linear range sensor was fabricated using the Cr Schottky photodiode array. The sensor showed excellent characteristics for use in G3 facsimile.
机译:具有Cr / a-Si:H锡掺杂氧化铟(ITO)的Cr肖特基非晶硅(a-Si:H)光电二极管,其中Cr相对于ITO相对于常规偏置方向呈负偏置。其特点是为经济的线性图像传感器提供简单稳定的传感器元件。发现Cr / a-Si:H结的势垒高度足够高(0.89 eV)以防止电子注入,并且该结是热稳定的。通过百万分之几的硼掺杂,大大改善了在a-Si:H层中传播的空穴的传输性质,结果实现了光电流的饱和。使用Cr肖特基光电二极管阵列制造了接触式ISO A4、8点/ mm线性范围传感器。该传感器显示出可用于G3传真机的出色特性。

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