首页> 外文期刊>IEEE Transactions on Electron Devices >Analytical model of shot noise in double-barrier resonant-tunneling diodes
【24h】

Analytical model of shot noise in double-barrier resonant-tunneling diodes

机译:双势垒谐振隧道二极管散粒噪声的解析模型

获取原文
获取原文并翻译 | 示例

摘要

The shot noise in double-barrier diodes is analyzed using the stationary-state approach to resonant tunneling through the first quasi-bound level. Significant deviations from full shot noise are predicted. Significant shot noise suppression occurs in the entire positive differential resistance region below the current peak, and shot noise enhancement occurs in the negative differential resistance region above the peak. The physical basis for these effects is assumed to be the modulation of the double-barrier transmission probability by charge stored in the first quasi-bound level in the quantum well. The analysis confirms microwave noise measurements of high-speed double-barrier diodes.
机译:使用稳态方法通过第一个准绑定能级进行共振隧穿来分析双势垒二极管中的散粒噪声。可以预测出与散粒噪声的显着偏差。明显的散粒噪声抑制发生在当前峰值以下的整个正差分电阻区域中,散粒噪声增强发生在峰值以上的负差分电阻区域中。假定这些效应的物理基础是通过存储在量子阱中第一个准界能级中的电荷对双壁垒传输概率的调制。该分析证实了高速双势垒二极管的微波噪声测量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号