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首页> 外文期刊>IEEE Transactions on Electron Devices >A high-speed 16-kb GaAs SRAM of less than 5 ns using triple-level metal interconnection
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A high-speed 16-kb GaAs SRAM of less than 5 ns using triple-level metal interconnection

机译:使用三级金属互连,不到5 ns的高速16kb GaAs SRAM

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The authors have realized 16-kb SRAMs with maximum address access time of less than 5 ns and typical power dissipation of less than 2 W at temperatures ranging from 25 degrees C to 100 degrees C. For the RAMs, they have developed a triple-level Au-based interconnection technology that reduces the wiring length and chip size of the SRAM so as to achieve high speed and high yield. Consequently, the wiring length and chip size are reduced to 69% and 58%, respectively, of those obtained by in previous work. The authors experimentally compared the delay time incurred by double-level interconnection and that by triple-level interconnection. This ratio is found to agree well with the simulated one by a model with distributed RC delay. After successfully suppressing Au hillock generation by lowering the process temperature, yield per wafer of 10% is obtained.
机译:作者已经实现了16kb的SRAM,在25℃至100℃的温度范围内,其最大地址访问时间小于5ns,典型功耗小于2W。对于RAM,他们开发了三层级基于金的互连技术,可减小SRAM的布线长度和芯片尺寸,从而实现高速和高良率。因此,布线长度和芯片尺寸分别减小到先前工作中获得的布线长度和芯片尺寸的58%。作者通过实验比较了双层互连和三层互连产生的延迟时间。通过具有分布式RC延迟的模型,发现该比率与模拟比率非常吻合。通过降低工艺温度成功抑制金小丘的产生后,每片晶圆的成品率可达到10%。

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