首页> 外文会议>Gallium Arsenide Integrated Circuit (GaAs IC) Symposium, 1990. Technical Digest 1990., 12th Annual >A high-speed GaAs 16 Kb SRAM of 4.4 ns/2 W using triple-level metal interconnection
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A high-speed GaAs 16 Kb SRAM of 4.4 ns/2 W using triple-level metal interconnection

机译:使用三级金属互连的4.4 ns / 2 W高速GaAs 16 Kb SRAM

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A fully functional GaAs 16 K SRAM is realized with an address access time of 4.4 ns and a power dissipation of 2 W. In the fabrication process, a triple-level Au-based interconnection technology is developed to reduce the wiring length, which strongly affects the delay time. The wiring length and chip size are drastically reduced to 69% and 58% of those previously reported by the authors, respectively. High wafer yield of 10% is also obtained by using this technology. Moreover, high-speed and stable operation of less than 5 ns is achieved for the temperature range from 25 to 100 degrees C.
机译:实现了功能齐全的GaAs 16 K SRAM,其地址访问时间为4.4 ns,功耗为2W。在制造过程中,开发了一种基于三级Au的互连技术以减少布线长度,这严重影响了布线效率。延迟时间。布线长度和芯片尺寸分别大幅减少至作者先前报告的那些比例的69%和58%。通过使用该技术,还可获得10%的高晶圆产量。此外,在25至100摄氏度的温度范围内,可以实现不到5 ns的高速且稳定的运行。

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