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首页> 外文期刊>Electronics >Numerical Drift-Diffusion Simulation of GaAs p-i-n and Schottky-Barrier Photodiodes for High-Speed A III B V On-Chip Optical Interconnections
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Numerical Drift-Diffusion Simulation of GaAs p-i-n and Schottky-Barrier Photodiodes for High-Speed A III B V On-Chip Optical Interconnections

机译:GaAs p-i-n和肖特基势垒光电二极管高速A III B V片上光学互连的数值漂移扩散模拟

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摘要

In this paper, we consider the problem of the research and development of high-speed semiconductor photodetectors suitable for operation as parts of on-chip optical interconnections together with the high-speed laser modulators based on the A III B V nanoheterostructures. This research is aimed at the development of the models and modelling aids designed for the simulation of carrier transport and accumulation processes taking place in on-chip photosensitive devices during the detection of subpicosecond laser pulses. Another aim of the paper is to apply the aforementioned aids for the investigation of GaAs p-i-n and Schottky-barrier photodiodes. We propose the non-stationary drift-diffusion models, an original numerical simulation technique and the applied software allowing one to simulate the photosensitive devices with different electrophysical, constructive and technological parameters. We have taken into account different kinds of carrier generation and recombination processes, the effects of electron intervalley transition and carrier drift velocity saturation in order to improve the simulation results’ adequacy. We have concluded that the influence of these effects on the performance of photodetectors for on-chip optical interconnections is significant. The response time of GaAs p-i-n and Schottky-barrier photodiodes calculated taking into account the drift velocity dependence on electric field intensity is insufficient for the adequate detection of subpicosecond laser pulses. According to the simulation results, it is reasonable to develop the methods aimed at the increase in the drift velocity of charge carriers in the photodetector active region by means of built-in electric field reduction.
机译:在本文中,我们考虑了适合作为片上光学互连的一部分运行的高速半导体光电探测器以及基于A III B V纳米异质结构的高速激光调制器的研究和开发问题。这项研究的目的是开发模型和建模辅助工具,这些模型和模型辅助工具被设计用于模拟在亚皮秒激光脉冲检测过程中片上光敏器件中发生的载流子传输和累积过程。本文的另一个目的是将上述辅助手段用于研究GaAs p-i-n和肖特基势垒光电二极管。我们提出了非平稳的漂移扩散模型,一种原始的数值模拟技术和应用软件,该软件可以模拟具有不同电物理,构造和技术参数的光敏器件。为了提高仿真结果的充分性,我们考虑了不同种类的载流子产生和重组过程,电子间隔跃迁和载流子漂移速度饱和的影响。我们已经得出结论,这些影响对片上光学互连的光电检测器性能的影响是巨大的。考虑到漂移速度对电场强度的依赖性而计算出的GaAs p-i-n和肖特基势垒光电二极管的响应时间不足以充分检测亚皮秒激光脉冲。根据仿真结果,合理的方法是通过内置的电场减少方法来提高光电检测器有源区域中载流子的漂移速度。

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