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首页> 外文期刊>IEEE Transactions on Electron Devices >Highly doped InGaP/InGaAs/GaAs pseudomorphic HEMT's with 0.35 /spl mu/m gates
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Highly doped InGaP/InGaAs/GaAs pseudomorphic HEMT's with 0.35 /spl mu/m gates

机译:具有0.35 / spl mu / m栅极的高掺杂InGaP / InGaAs / GaAs伪晶HEMT

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摘要

We fabricated 0.35-/spl mu/m gate-length pseudomorphic HEMT DCFL circuits using a highly doped thin InGaP layer as the electron supply layer. The InGaP/InGaAs/GaAs pseudomorphic HEMT grown by MOVPE is suitable for short gate-length devices with a low supply voltage since it does not show short channel effects even for gate length down to 0.35 /spl mu/m. We obtained a K value of 555 mS/Vmm and a transconductance g/sub m/ of 380 mS/mm for an InGaP layer 18.5 nm thick. Fabricated 51-stage ring oscillators show the basic propagation delay of 11 ps and the power-delay product of 7.3 fJ at supply voltage of V/sub DD/ of 1 V, and 13.8 ps and 3.2 fJ at V/sub DD/ of 0.6 V for gates 10 /spl mu/m wide.
机译:我们使用高掺杂的薄InGaP层作为电子供应层,制作了0.35- / splμ/μm的栅长假晶HEMT DCFL电路。 MOVPE生产的InGaP / InGaAs / GaAs伪晶HEMT适用于具有低电源电压的短栅极长度器件,因为即使栅极长度低至0.35 / spl mu / m,它也不会表现出短沟道效应。对于18.5 nm厚的InGaP层,我们获得的K值为555 mS / Vmm,跨导g / sub m /为380 mS / mm。制成的51级环形振荡器在11 V的电源电压下的基本传播延迟为11 ps,电源延迟积为7.3 fJ,在V / sub DD /的电源电压下为13.8 ps和3.2 fJ V用于10 / spl mu / m宽的门。

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