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Silicon Germanium CMOS Optoelectronic Switching Device: Bringing Light to Latch

机译:硅锗CMOS光电开关设备:为闩锁带来光

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We propose a novel semiconductor optoelectronic (OE) switch that is a fusion of a Ge optical detector and a Si metal-oxide-semiconductor (MOS) field-effect transistor (FET). The device operation principle is investigated, and the performance is explored by simulations. The proof of principle is demonstrated by experiments. The use of Ge enables operation in standard telecommunication wavelengths, in addition to providing the surrounding Si circuitry with noise immunity from signaling. The transconductance of the FET provides amplification, and an experimental current gain of up to 1000 is demonstrated. A complementary function is shown by tailoring the doping profiles. The circuit performance of a complementary pair using the International Technology Roadmap for Semiconductors values for the 150-nm node is evaluated by simulation, yielding ~100-ps cycle times. The switch can be fabricated in the nanoscale regime along with a high-performance Si complementary MOS. A very low capacitance can be achieved due to the isolation of the detection region from the current drive. OE conversion that is performed with such a compact device offers the potential of inserting light at the latch level in a microprocessor.
机译:我们提出了一种新颖的半导体光电(OE)开关,它是Ge光学检测器和Si金属氧化物半导体(MOS)场效应晶体管(FET)的融合。研究了器件的工作原理,并通过仿真探索了性能。实验证明了原理的证明。 Ge的使用除了为周围的Si电路提供抗信号噪声的能力之外,还使它能够在标准电信波长下工作。 FET的跨导提供放大,并证明了高达1000的实验电流增益。通过定制掺杂轮廓来显示补充功能。通过仿真评估了使用国际半导体技术路线图针对150 nm节点的互补对的电路性能,得出了约100 ps的周期时间。该开关可以与高性能的Si互补MOS一起在纳米级制程中制造。由于检测区域与电流驱动器隔离,因此可以实现非常低的电容。使用这种紧凑型设备执行的OE转换具有将光插入微处理器中锁存器级别的潜力。

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