机译:垂直太赫兹GaN转移电子器件的差分掺杂分布
Dept. Hyperfreq. et Semicond., Inst. d'Electron. de Microelectron. et de Nanotechnol., Villeneuve d'Ascq, France;
Gunn devices; III-V semiconductors; doping profiles; gallium compounds; semiconductor device models; semiconductor doping; terahertz wave devices; wide band gap semiconductors; 1D numerical physical macroscopic model; GaN; P+ spike type notch; TED oscillator modeling; detached notch; differentiated doping profile; dipole domain mode; energy-momentum approach; frequency 1 THz; millimeter-wave differentiated TEDs; semiconductor device model; terahertz TED; time-domain continuous wave pure sine model; vertical terahertz transferred-electron devices; Doping; Gallium nitride; Oscillators; Performance evaluation; Radio frequency; Resistance; Semiconductor process modeling; Differentiated doping profile; fundamental accumulation layer and transit time operating mode; time-domain energy-momentum modeling; vertical terahertz gallium nitride (GaN) transferred electron device (TED); vertical terahertz gallium nitride (GaN) transferred electron device (TED).;
机译:时域能量/动量建模的太赫兹GaN台面转移电子器件的理论研究
机译:在漂移区内具有任意垂直掺杂分布的横向功率器件的分析模型
机译:传统掺杂pn和自然极化超结器件的垂直GaN性能限制
机译:基于梯度间隙半导体氮化物和氮化硼太赫兹范围的转移电子器件的数值模拟
机译:GaN-On-GaN垂直功率器件的电子显微镜表征= GaN-On-GaN垂直功率器件的电子显微镜表征
机译:掺Ge的垂直GaN肖特基势垒二极管的恢复性能
机译:激光诱导的局部激活Mg掺杂GaN,具有高功率垂直装置的高横向分辨率