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首页> 外文期刊>Electron Devices, IEEE Transactions on >Modeling of the Lateral Emitter-Current Crowding Effect in SiGe HBTs
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Modeling of the Lateral Emitter-Current Crowding Effect in SiGe HBTs

机译:SiGe HBT中的横向发射极电流拥挤效应建模

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摘要

Two-section models for capturing the lateral ac emitter-current crowding effect, which is also known as the lateral nonquasi-static (NQS) effect, are presented following a consistent approach based on a model formulation for ac operating condition. Following the theoretical results, model formulations suitable for implementation in the large-signal domain are developed. The proposed two-section model performs better than the state-of-the-art model in both the large-signal and small-signal domains and appears to be suitable for accurately capturing the lateral NQS effect.
机译:根据用于交流工作条件的模型公式,采用一致的方法,提出了两部分模型,用于捕获横向交流发射极电流拥挤效应(也称为横向非准静态(NQS)效应)。根据理论结果,开发了适用于大信号领域的模型公式。所提出的两部分模型在大信号和小信号域中的性能均优于最新模型,并且似乎适合于准确捕获横向NQS效果。

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