A Comprehensive Physics-Based Current–Voltage SPICE Compact Model for 2-D-Material-Based Top-Contact Bottom-Gated Schottky-Barrier FETs

摘要

In this article, we report the development of a novel physics-based analytical model for explaining the current–voltage relationship in Schottky barrier (SB) 2-D-material field effect transistors (FETs). The model has at its core the calculation of the surface-potential (SP) which is accomplished by invoking 2-D density of states in conjunction with Fermi–Dirac (FD) distribution for electron and hole statistics. The explicit computation for the SP, carried out using the Lambert-W function together with Halley’s method, is used to construct the SP-based band-diagram for realizing the transparency of the SBs. Thereafter, the ambipolar current is derived in terms of the electron and hole injection phenomena—the thermionic emission and Fowler–Nordheim tunneling mechanisms—at the SB contacts. Furthermore, drift-diffusion current is derived in terms of the SP and incorporated in the model to account for the scattering in the intrinsic 2-D channel. Finally, the Verilog-A model is validated against experimental ${I}-{V}$ data reported in the literature for two different 2-D-material systems. This is the first demonstration of an explicit SP-based SPICE model for ambipolar SB-2-D-FETs that is simultaneously built on tunneling-emission and drift-diffusion formalisms.