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An ON-Resistance Model for Silicon Carbide Merged p-i-n Schottky (MPS) Diodes

机译:碳化硅合并P-I-N肖特基(MPS)二极管的导通电阻模型

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摘要

A novel resistance model of silicon-carbide-merged p-i-n Schottky diodes is presented in this article. With this model, the device characteristics and power dissipation can be predicted. The ON-resistance in the three operating modes, namely, unipolar, low-injection, and high-injection modes, is calculated. In the unipolar and low-injection modes, the effect of temperature on carrier mobility and conduction angle are added to the factors that need to be considered, whereas the influence of current density is considered in the high-injection mode. The carrier distribution in the high-injection mode is analyzed and applied to determine the resistance. And this resistance model is applied to the research of a forward characteristic model. The model is verified experimentally via the comparison of the calculated and measured characteristics. The experimental results prove that the model can not only predict the resistance in each working mode, but also accurately predict the forward current and voltage characteristics.
机译:本文提出了一种新型碳化硅合并P-I-N肖特基二极管的电阻模型。利用该模型,可以预测设备特性和功耗。计算三种操作模式,即单极,低注射和高注射模式的耐抗导电。在单极和低注射模式中,将温度对载流子迁移和导电角的影响加入需要考虑的因素,而电流密度的影响是在高喷射模式中考虑的。分析高喷射模式中的载流子分布并施加以确定电阻。并且这种电阻模型应用于前向特征模型的研究。通过计算和测量特性进行实验验证该模型。实验结果证明,该模型不仅可以预测每个工作模式中的电阻,而且还可以精确地预测前电流和电压特性。

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