首页> 外文期刊>IEEE Transactions on Electron Devices >Study of a 0.35 THz Extended Interaction Oscillator Driven by a Pseudospark-Sourced Sheet Electron Beam
【24h】

Study of a 0.35 THz Extended Interaction Oscillator Driven by a Pseudospark-Sourced Sheet Electron Beam

机译:由伪气柱 - 源板电子束驱动的0.35 ZHz延伸相互作用振荡器的研究

获取原文
获取原文并翻译 | 示例

摘要

A compact high-power extended interaction oscillator (EIO) driven by a pseudospark-sourced (PS-sourced) sheet electron beam (SEB) is presented at 0.35 THz. It combines the advantages of a planar interaction circuit and a SEB generated from the PS discharge, including a large beam cross-section, high gain per unit length, and high current density with the additional benefit of not requiring an external focusing magnetic field. Staying within what is achievable with microfabrication techniques, the influence of tolerance on the Q value, resonance frequency, and characteristic impedance was investigated. The effect of surface roughness caused by the manufacturing method on Ohmic loss of the material surface was studied. The advanced microfabrication techniques of Ultra Violet Lithographie, Galvanik, and Abformung (UV-LIGA) and Nano-computer numerical control (Nano-CNC), which are capable of realizing high precision and a metal surface of sufficient smoothness, were proposed to manufacture the planar structures. The effect of plasma density in PS-sourced SEB on the resonance frequency of the EIO circuit was investigated. The simulation results showed that the output signal had a slight frequency upshift and a decrease of the output power as the plasma density increased at 0.35 THz, which is consistent with the theoretical analysis. Beam-wave interaction simulations for this planar EIO predicted a peak output power of 1.8 kW at 0.35 THz using an effective value of conductivity of S/m to take into account the skin depth and surface roughness.
机译:由Pseudospark-Sourced(PS-Sourced)片电子束(SEB)驱动的紧凑型大功率扩展相互作用振荡器(EIO)以0.35至THz表示。它结合了平面相互作用电路的优点和从PS放电产生的SEB,包括大的光束横截面,每单位长度高,高电流密度,以及不需要外部聚焦磁场的额外益处。研究了微制造技术可实现的,研究了耐受对Q值,共振频率和特征阻抗的影响。研究了制造方法对材料表面欧姆损耗引起的表面粗糙度的影响。提出了能够实现高精度和金属表面的超紫光光刻,Galvanik和Abformung(UV-LIGA)和纳米计算机数控(Nano-CNC)的先进微制造技术。平面结构。研究了等离子体密度在EIO回路的共振频率上的PS-源SEB中的影响。仿真结果表明,由于等离子体密度在0.35至THz增加,输出信号具有略微频率升档,并且输出功率降低,这与理论分析一致。该平面EIO的光束波相互作用模拟使用S / M的电导率的有效值预测0.35六茨的峰值输出功率,以考虑肤色和表面粗糙度。

著录项

  • 来源
    《IEEE Transactions on Electron Devices》 |2020年第2期|652-658|共7页
  • 作者单位

    Univ Elect Sci & Technol China Sch Elect Sci & Engn Vacuum Elect Natl Lab Chengdu 610054 Peoples R China|Univ Strathclyde Dept Phys Glasgow G4 0NG Lanark Scotland;

    Univ Strathclyde Dept Phys Glasgow G4 0NG Lanark Scotland;

    Univ Strathclyde Dept Phys Glasgow G4 0NG Lanark Scotland;

    Shenzhen Univ Coll Elect Sci & Technol Shenzhen 518060 Peoples R China;

    Univ Strathclyde Dept Phys Glasgow G4 0NG Lanark Scotland;

    Univ Strathclyde Dept Phys Glasgow G4 0NG Lanark Scotland;

    Queen Marry Univ London Sch Elect Engn & Comp Sci London E1 4NS England;

    Queen Marry Univ London Sch Elect Engn & Comp Sci London E1 4NS England;

    Queen Marry Univ London Sch Elect Engn & Comp Sci London E1 4NS England;

    Univ Elect Sci & Technol China Sch Elect Sci & Engn Vacuum Elect Natl Lab Chengdu 610054 Peoples R China;

    Univ Elect Sci & Technol China Sch Elect Sci & Engn Vacuum Elect Natl Lab Chengdu 610054 Peoples R China;

    Univ Strathclyde Dept Phys Glasgow G4 0NG Lanark Scotland;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Extended interaction oscillator (EIO); high power radiation; pseudospark-sourced (PS-sourced) electron beam; sheet electron beam (SEB); terahertz;

    机译:扩展互动振荡器(EIO);高功率辐射;伪气柱 - 源(P​​S-Sourced)电子束;片电子束(SEB);太赫兹;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号