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首页> 外文期刊>IEEE Electron Device Letters >1.2 kV trench insulated gate bipolar transistors (IGBT's) with ultralow on-resistance
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1.2 kV trench insulated gate bipolar transistors (IGBT's) with ultralow on-resistance

机译:具有超低导通电阻的1.2 kV沟槽绝缘栅双极晶体管(IGBT)

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摘要

In this letter, we report the full development of 1.2 kV Trench IGBT's with ultralow on-resistance, latch-up free operation and highly superior overall performance when compared to state of the art IGBT's. The minimum forward voltage drop at the standard current density of 100 A/cm/sup 2/ was 1.1 V for nonirradiated devices and 2.1 V for irradiated devices. The maximum controllable current density was in excess of 1000 A/cm/sup 2/.
机译:在这封信中,我们报告了与最先进的IGBT相比,具有超低导通电阻,无闩锁操作和高度优越的整体性能的1.2 kV沟渠IGBT的全面开发。对于非辐照设备,在100 A / cm / sup 2 /的标准电流密度下的最小正向压降为1.1 V,对于辐照设备为2.1V。最大可控电流密度超过1000 A / cm / sup 2 /。

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