Improved Reliability of AlGaN-GaN HEMTs Using an NH{sub}3 Plasma Treatment Prior to SiN Passivation

摘要

A passivation method has been developed which reduces the degradation of AlGaN-GaN high electron mobility transistor (HEMT) electrical properties caused by extended dc bias or microwave power operation. The key aspect of this passivation technique is exposure to a low-power NH{sub}3 plasma prior to SiN deposition. Devices fabricated with the NH{sub}3 treatment prior to SiN passivation show minimal gate lag and current collapse after extended dc bias operation. In addition, the rate of degradation of the microwave power output while under continuous microwave operation is improved by at least 100 times as compared to SiN passivated HEMTs that were not treated with the NH{sub}3 plasma.