首页> 外文期刊>IEEE Electron Device Letters >Field-Plated Ga2O3 Trench Schottky Barrier Diodes With a BV2/ Ron,sp of up to 0.95 GW/cm2
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Field-Plated Ga2O3 Trench Schottky Barrier Diodes With a BV2/ Ron,sp of up to 0.95 GW/cm2

机译:现场镀Ga2O3沟槽肖特基势垒二极管,具有高达0.95 GW / CM2的BV2 / RON

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摘要

We report the realization of field-plated vertical Ga2O3 trench Schottky barrier diodes (SBDs). The trench SBDs show significantly lower leakage current than regular SBDs. With employment of field plate, a breakdown voltage (BV) of 2.89 kV is achieved, which is similar to 500 V higher than those without field plate. Trench sidewall depletion is observed, and the average depletion width is extracted using an analytical model. The trench SBDs have a differential specific on-resistance(R-on,R-sp) of 10.5 (8.8) m Omega.cm(2) from DC (pulsed) measurements, which leads to a Baliga's figure-of-merit (BV2/R-on,R-sp) of 0.80 (0.95) GW/cm(2) - the highest among Ga2O3 power devices to date.
机译:我们报告了现场镀垂直GA2O3沟槽肖特基势垒二极管(SBD)的实现。沟槽SBD显示出比常规SBD的漏电流明显较低。利用现场板的就业,实现了2.89kV的击穿电压(BV),其比没有现场板的那些相似的500V。观察到沟槽侧壁耗尽,并使用分析模型提取平均耗尽宽度。沟槽SBD具有来自DC(脉冲)测量的10.5(8.8)M OMEGA.cm(2)的差动特异性导通电阻(R-ON,R-SP),从而导致Baliga的优点(BV2) / R-ON,R-SP)为0.80(0.95)GW / cm(2) - 迄今为止的GA2O3电源设备中最高。

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