Test Generation for Crosstalk-Induced Delay Faults in VLSI Circuits Using Modified FAN Algorithm

摘要

As design trends move toward nanometer technology, new problems due to noise effects lead to a decrease in reliability and performance of VLSI circuits. Crosstalk is one such noise effect which affects the timing behaviour of circuits. In this paper, an efficient Automatic Test Pattern Generation (ATPG) method based on a modified Fanout Oriented (FAN) to detect crosstalk-induced delay faults in VLSI circuits is presented. Tests are generated for ISCAS_85 and enhanced scan version of ISCAS_89 benchmark circuits. Experimental results demonstrate that the test program gives better fault coverage, less number of backtracks, and hence reduced test generation time for most of the benchmark circuits when compared to modified Path-Oriented Decision Making (PODEM) based ATPG. The number of transitions is also reduced thus reducing the power dissipation of the circuit.