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A Back-Illuminated Time-of-Flight Image Sensor with SOI-Based Fully Depleted Detector Technology for LiDAR Application

机译:具有基于SOI的全耗尽检测器技术的背照式飞行时间图像传感器,适用于LiDAR应用

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A back-illuminated time-of-flight (ToF) image sensor based on a 0.2 ?μm silicon-on-insulator (SOI) CMOS detector technology using fully-depleted substrate is developed for the light detection and ranging (LiDAR) applications. A fully-depleted 200 ?μm-thick bulk silicon is used for the higher quantum efficiency (QE) in a near-infrared (NIR) region. The developed SOI pixel structure has a 4-tapped charge modulator with a draining function to achieve a higher range resolution and to cancel background light signal. A distance is measured up to 27 m with a range resolution of 12 cm at the outdoor and average light power density is 150 mW/m2@30 m.
机译:已开发出一种基于0.2μm绝缘体上硅(SOI)CMOS检测器技术的背照式飞行时间(ToF)图像传感器,该技术使用了完全耗尽的基板,用于光检测和测距(LiDAR)应用。全耗尽的200 µm厚的块状硅用于近红外(NIR)区域中的更高量子效率(QE)。发达的SOI像素结构具有带抽水功能的4抽头电荷调制器,可实现更高的范围分辨率并消除背景光信号。在室外测量的距离可达27 m,范围分辨率为12 cm,平均光功率密度为150 mW / m2 @ 30 m。

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