Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method

Anna Z. Evmenova; Fedir F. Sizov; Mykola V. Vuichyk; Volodymyr A. Odarych

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Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method

机译：椭偏法测定吸收性CdTe薄膜的光学参数和膜厚

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《Optica applicata》 |2008年第3期|共页
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Anna Z. Evmenova; Fedir F. Sizov; Mykola V. Vuichyk; Volodymyr A. Odarych;
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中图分类光学;
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1. Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method [J] . Evmenova AZ, Odarych VA, Sizov FF, Optica applicata . 2008,第3期

机译：椭偏法测定吸收性CdTe薄膜的光学参数和膜厚
2. Effect of film thickness on microstructure parameters and optical constants of CdTe thin films [J] . E.R. Shaaban, N. Afify, A. El-Taher Journal of Alloys and Compounds: An Interdisciplinary Journal of Materials Science and Solid-state Chemistry and Physics . 2009,第1a2期

机译：膜厚对CdTe薄膜微观结构参数和光学常数的影响
3. Ellipsometric determination of the optical constants of glassy As2S3 thin films in the weak absorption region [J] . Kozak MI, Zhikharev VN, Studenyak IP, Optics and Spectroscopy . 2006,第4期

机译：椭圆光度法测定弱吸收区中玻璃态As2S3薄膜的光学常数
4. Comparison of ellipsometric methods for separate determination of thickness and optical constants of thin films [C] . E. G. Bortchagovsky, O. M. Getsko Society of Photo-Optical Instrumentation Engineers Conference on Lightmetry :Metrology, Spectroscopy, and Testing Techniques Using Light . 2001

机译：椭圆型测定薄膜厚度和光学常数测定的比较
5. Determination of carbon nanotube thin film thickness and optical parameters by a new modified prism waveguide coupler system [D] . Baltas, Georgios 2013

机译：新型改进的棱镜波导耦合器系统测定碳纳米管薄膜的厚度和光学参数
6. Optical Absorption Enhancement in CdTe Thin Films by Microstructuration of the Silicon Substrate [O] . Jesús Rangel-Cárdenas, Hugo Sobral 2017

机译：通过硅基底的微结构增强CdTe薄膜的光吸收
7. Ellipsometric Measurement of Optical Constants and Thickness of Passive Films Formed on 18ndash;8 Stainless Steel [O] . Shiro Matsuda, Katsuhisa Sugimoto, Yoshinobu Sawada 1977

机译：在18-8不锈钢中形成的光学常数和无源膜厚度的椭圆测量

Absorptive CdTe films optical parameters and film thickness determination by the ellipsometric method

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