首页> 外国专利> Absorption knife for the determination of the thickness, moisture or other parameters of a film or a coating.

Absorption knife for the determination of the thickness, moisture or other parameters of a film or a coating.

机译:吸收刀,用于确定薄膜或涂层的厚度,湿度或其他参数。

摘要

The apparatus includes means for directing a plurality of beams of radiation of different spectral compositions to a sample such as a film or coating. A part of the beams is transmitted through the sample and received by a radiation detector. Another part of the beams reflected by the sample is in turn reflected, preferably by a concave mirror, back through the sample onto another radiation detector. The signals `a` and `b` from the detectors are combined in accordance with the relationship a/(1-b/a) to suppress optical interference effects.
机译:该设备包括用于将具有不同光谱组成的多个辐射束引导到诸如膜或涂层的样品的装置。光束的一部分透射穿过样品,并被辐射探测器接收。被样品反射的光束的另一部分依次被反射,最好被凹面镜反射,穿过样品回到另一个辐射探测器。来自检测器的信号“ a”和“ b”根据关系a /(1-b / a)被组合以抑制光学干涉效应。

著录项

  • 公开/公告号DE3685631T2

    专利类型

  • 公开/公告日1992-12-24

    原文格式PDF

  • 申请/专利权人 INFRARED ENG GB;

    申请/专利号DE19863685631T

  • 发明设计人 EDGAR ROGER FOERS DR GB;

    申请日1986-11-04

  • 分类号G01N21/35;G01B11/06;G01N21/86;

  • 国家 DE

  • 入库时间 2022-08-22 05:02:22

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