首页> 外国专利> OPTICAL RECORDING MEDIUM, FILM THICKNESS MEASUREMENT METHOD OF THE SAME, FILM THICKNESS CONTROL METHOD, MANUFACTURING METHOD, FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS CONTROLLER

OPTICAL RECORDING MEDIUM, FILM THICKNESS MEASUREMENT METHOD OF THE SAME, FILM THICKNESS CONTROL METHOD, MANUFACTURING METHOD, FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS CONTROLLER

机译:光学记录介质,相同厚度的薄膜厚度测量方法,薄膜厚度控制方法,制造方法,薄膜厚度测量装置和薄膜厚度控制器

摘要

PROBLEM TO BE SOLVED: To measure the film thickness of a recording layer easily by a transmission method in an optical recording medium which has a reflective layer, etc., between a substrate and the recording layer.;SOLUTION: This optical recording medium is provided with a reflective layer 3 between a light transmitting substrate 1 and a dyestuff containing recording layer 5 on which information is recorded optically. The area of the dyestuff containing recording layer 5 is formed wider than the area of the reflective layer 3 by prescribed areas 30a, 30b.;COPYRIGHT: (C)2004,JPO&NCIPI
机译:解决的问题:在基板和记录层之间具有反射层等的光记录介质中,通过透射法容易地测量记录层的膜厚。解决方案:提供该光记录介质在透光衬底1和含染料的记录层5之间具有反射层3,在该记录层5上光学地记录信息。包含染料的记录层5的区域形成为比反射层3的区域宽规定区域30a,30b 。;版权:(C)2004,JPO&NCIPI

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号