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Influence of Temperature and Pentacene Thickness on the Electrical Parameters in Top Gate Organic Thin Film Transistor

机译:温度和并五苯厚度对顶栅有机薄膜晶体管电学参数的影响

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In this contribution, we report on the effect of pentacene thickness and temperature on the performance of top gate transistors. We first investigated the temperature dependence of the transport properties in the temperature range of 258 K - 353 K. The electrical characteristics showed that the threshold voltage (VT) and the onset voltage (Von) remain unchanged. However, the subthreshold current (Ioff), the on-current (Ion) and the field effect mobility (μ) are highly affected with a slight deterioration of subthreshold slope. We observed Arrhenius-like behavior suggesting a thermally activated mobility with an activation energy EA = 68 meV. Moreover the dependence of the charge carrier mobility on the organic semiconductor thickness has also been studied. The mobility decreased as the pentacene thickness increases whereas the threshold voltage and Ioff current remain minimally affected. In order to understand the transport properties and in view to put in light morphology peculiarities of pentacene, AFM images were performed. It turns out that the pentacene grain sizes are smaller and disorganized as the film thickness increases, and charge carriers are more prone to be trapped, leading to decrease the field effect mobility and the Ion current. The devices were also tested under bias stress and the transistors with low thicknesses exhibited a relatively good electrical stability compared to those with high pentacene thicknesses. This work points out the influence of temperature, semiconductor thickness and bias stress effect on the device performance and stability of transistor using top gate configuration.
机译:在这项贡献中,我们报告了并五苯厚度和温度对顶栅晶体管性能的影响。我们首先研究了在258 K-353 K温度范围内传输特性的温度依赖性。电学特性表明阈值电压(VT)和起始电压(Von)保持不变。但是,亚阈值电流(Ioff),导通电流(Ion)和场效应迁移率(μ)受亚阈值斜率的轻微影响而受到严重影响。我们观察到类似于阿累尼乌斯的行为,表明热激活的迁移率为EA = 68 meV。此外,还研究了载流子迁移率对有机半导体厚度的依赖性。随着并五苯厚度的增加,迁移率降低,而阈值电压和Ioff电流的影响保持最小。为了理解并五苯的传输性质并考虑其光形态特征,进行了AFM图像。结果表明,并五苯晶粒尺寸较小,并且随着膜厚度的增加而变得混乱,并且电荷载流子更容易被捕获,从而导致场效应迁移率和离子电流降低。该器件还在偏压力下进行了测试,与具有并五苯厚度的晶体管相比,具有低厚度的晶体管具有相对较好的电稳定性。这项工作指出了温度,半导体厚度和偏应力效应对使用顶栅配置的晶体管的器件性能和稳定性的影响。

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