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Graph Modeling for Static Timing Analysis at Transistor Level in Nano-Scale CMOS Circuits

机译:纳米级CMOS电路中晶体管级静态时序分析的图形建模

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The development and the revolution of nanotechnology require more and effective methods to accurately estimating the timing analysis for any CMOS transistor level circuit. Many researches attempted to resolve the timing analysis, but the best method found till the moment is the Static Timing Analysis (STA). It is considered the best solution because of its accuracy and fast run time. Transistor level models are mandatory required for the best estimating methods, since these take into consideration all analysis scenarios to overcome problems of multiple-input switching, false paths and high stacks that are found in classic CMOS gates. In this paper, transistor level graph model is proposed to describe the behavior of CMOS circuits under predictive Nanotechnology SPICE parameters. This model represents the transistor in the CMOS circuit as nodes in the graph regardless of its positions in the gates to accurately estimating the timing analysis rather than inaccurate estimating which caused by the false paths at the gate level. Accurate static timing analysis is estimated using the model proposed in this paper. Building on the proposed model and the graph theory concepts, new algorithms are proposed and simulated to compute transistor timing analysis using RC model. Simulation results show the validity of the proposed graph model and its algorithms by using predictive Nano-Technology SPICE parameters for the tested technology. An important and effective extension has been achieved in this paper for a one that was published in international conference.
机译:纳米技术的发展和革命需要更多有效的方法来准确估计任何CMOS晶体管级电路的时序分析。许多研究试图解决时序分析问题,但是到目前为止找到的最佳方法是静态时序分析(STA)。由于它的准确性和快速的运行时间,它被认为是最佳解决方案。晶体管级模型是最佳估计方法所必需的,因为它们考虑了所有分析情况,以克服经典CMOS门中发现的多输入开关,错误路径和高堆叠的问题。本文提出了晶体管级图模型来描述在预测性纳米技术SPICE参数下CMOS电路的行为。此模型将CMOS电路中的晶体管表示为图形中的节点,而不管其在栅极中的位置如何,以准确估计时序分析,而不是不准确地估计由栅极级错误路径引起的晶体管。使用本文提出的模型可以估算准确的静态时序分析。在提出的模型和图论概念的基础上,提出并仿真了新算法,以使用RC模型计算晶体管时序分析。仿真结果通过使用预测的纳米技术SPICE参数对所测试的技术证明了所提出的图形模型及其算法的有效性。本文已在国际会议上发表了一篇重要而有效的文章。

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