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首页> 外文期刊>Chalcogenide Letters >STUDY OF STRUCTURAL AND OPTICAL PROPERTIES OF Cd1-xCoxS THIN FILMS PREPARED BY THERMAL EVAPORATION METHOD
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STUDY OF STRUCTURAL AND OPTICAL PROPERTIES OF Cd1-xCoxS THIN FILMS PREPARED BY THERMAL EVAPORATION METHOD

机译:热蒸发法制备Cd1-xCoxS薄膜的结构和光学性能研究

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Thin films of cobalt doped cadmium sulfide with 50 nm thickness and different cobalt concentrations were deposited on glass substrates by thermal evaporation method. The structure of the films was investigated by X-ray diffractometry (XRD). It was revealed that the films have hexagonal structure with (002) preferred orientation. Transmittance and absorption spectra of the films were measured at wavelength range 250-1100 nm. Then the band gap and refractive index of the films were calculated by using transmittance and absorption spectra. The results indicated reduction of the band gap with increase in cobalt concentration.
机译:通过热蒸发法在玻璃基板上沉积厚度为50 nm,钴浓度不同的掺钴硫化镉薄膜。通过X射线衍射法(XRD)研究膜的结构。揭示了该膜具有六边形结构,具有(002)优选的取向。在250-1100nm的波长范围内测量膜的透射率和吸收光谱。然后利用透射率和吸收光谱计算膜的带隙和折射率。结果表明,随着钴浓度的增加,带隙减小。

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