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STRUCTURAL, OPTICAL AND ELECTRICAL PROPERTIES OF BRUSH PLATED ZnSe FILMS

机译:刷镀ZnSe薄膜的结构,光学和电学性质

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ZnSe films were brush plated on conducting glass substrates from a solution containing ZnSO4and SeO2 .The substrate temperature was varied in the range of 30 - 85°C. 3 ml of ZnSO4(0.25M) and 3ml of SeO2(0.05M) were taken as the precursors. X-ray diffraction studies indicated cubic structure. Direct band gap of 2.51 eV was obtained from absorption measurement for the films deposited at 85°C. Electrical measurements were made on the films by providing Indium contact at the centre of the top surface of the films. The films possessed a conductivity in the range of 1000 ohm cm - 100 ohm cm as the deposition temperature increases.
机译:用含ZnSO4和SeO2的溶液将ZnSe膜刷涂在导电玻璃基板上,基板温度在30-85°C的范围内变化。将3ml ZnSO4(0.25M)和3ml SeO2(0.05M)用作前体。 X射线衍射研究表明立方结构。通过在85℃下沉积的膜的吸收测量获得2.51eV的直接带隙。通过在薄膜顶表面的中心提供铟接触,对薄膜进行电学测量。随着沉积温度的升高,这些膜的电导率在1000 ohm cm-100 ohm cm的范围内。

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