Multifrequency analysis of faults in analog circuits

摘要

Testability analysis of analog circuits in the presence of soft, large-deviation, and hard faults greatly facilitates production of testable systems. The authors analyze these faults by observing their symptoms at the circuit's output, an approach that uses the same test methodology to analyze all three fault types. Their algorithm indicates the set of adequate test frequencies and nodes that increase fault observability. They conclude by generating test vectors for observing and covering these faults.